MSE推出增强型MXR-160自动X光检测系统,SMT,SMT技术文章-SMT行业资讯

Macrotron Scientific Engineering GmbH (MSE) presented the enhanced MXR 160, an automatic X-Ray inspection system. Focused on performance and quality the newly integrated x-ray technology increases the image quality significantly. A 30% throughput increase on performance site is achieved particularly with complex assemblies. The latest X-ray technology of the MXR-160 provides both a high geometrical resolution as well a high contrast resolution. The precise calibration of the "Field of View" and the grey-scale resolution ensures accurate and repeatable results. The system is suitable for inspection of semiconductors, i.e. for wire bonding test, lead frame, μBumps as well as X-ray inspection for PCBs specifically for Fine Pitch, Micro BGA und BGA test. The new X-ray navigator significantly simplifies the board testing. Time-saving and without loops, the system itself fully automatically creates an X-ray overview of the board. The image is promptly shown on the monitor. At any time the user has an overview of the actual board position. He can quickly and easily access the next test area via mouse click. X-Pert Solutions act as a statistic and verification tool for the system and provide the MXR-160 with In-line analyses and real-time statistics for fast failure assessment and trend monitoring.